Statistical Properties and Sensitivity of a New Adaptive Sampling Method for Quality Control

Abstract

We present a new adaptive sampling method for statistical quality control. In this method, called LSI (Laplace sampling intervals), we use the probability distribution function of the Laplace standard distribution to obtain the sampling instants, depending on a k parameter that allows control of sampling costs. Several algebraic expressions concerning the statistical properties of the LSI method are presented. We compare the LSI method with fixed sampling intervals (FSI) and variable sampling intervals (VSI) methods using a Shewhart X-bar control chart and evaluate the sensitivity of these sampling methods when the lower sampling interval is truncated. The results obtained show that the new method is a viable alternative in various critical contexts and situations.